• Hitachi H7000/7110 TEM/SCAN
• JEOL 100 CX II TEM/SCAN
• JEOL 100S TEM
• Philips 201 - TEM
• Philips CM 10 - Digital TEM
• Siemens Elmiskop 1a - TEM
• Zeiss EM10 C TEM
• Zeiss EMU 9 - TEM

Scanning EM (SEM) - Secondary electron imaging (SEI), Backscattered electron imaging (BEI), Cathodoilluminescent imaging (CLI), low temperature scanning electron microscopy (LTSEM), High resolution SEI, BEI

• JEOL 35 C Scanning Microscope
• JEOL 35 CF Scanning Microscope
• JEOL JSM T200 Scanning Electron Microscope
• JEOL 100 CX II TEM/SCAN
• Philips 505 Scanning Electron Microscope
• Hitachi H7000/7110 TEM/SCAN
• Zeiss Supra 35 FEG-VP

Analytical EM (AEM)

• EBSD - HKL Electron Backscatter Diffraction
• EDS - EDAX PV 9100 dispersive x-ray analyyzer
• EDS - EDAX Genesis 2000 dispersive x-ray analyyzer
• EDS - Link Analytical AN10000 energy dispersive x-ray analyzer
• EDS - Tracor Northern Series II x-ray microanalysis system
• WDS - ARL Microprobe X-Ray Analyzer - Wavelength Dispersive Spectroscopy

Scanning Probe Microscopy (SPM)

• Digital Instruments NanoScope III - Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM), AFM Tapping Mode

Light Microscopy

• Bright Field
• Dark Field
• Phase Contrast
• Differential Interference Contrast (DIC)
• Video Enhanced Contrast (VEC-DIC)
• Fluorescence

Laser scanning Confocal Microscopy

• Olympus FV500 Laser Scanning COnfocal Microscope
• Nikon PCM 2000 Laser Scanning Confocal Microscope
• Nikon Diaphot-TMD - Image 1 Dual Wavelength Fluorescence Imaging System
• ZEISS 10 Laser Scanning Microscope - Confocal mode, Fluorescence

Computer Skills

• Intel/AMD based machines (PC) - 8086, 8088, All X86 Series
• Mainframe machines - DEC PDP 10, DEC PDP 20, IBM 3090-180 VF
• Minicomputers - DEC PDP-11
• Operating Systems - DOS 1.0-6.11, Windows 3.x, Windows 9x, Windows NT,Windows XP & XP/64, Windows 2003,
  Macintosh OS 7.x, 8.x, Novell Netware 3.x, 4.x, 5.0, UNIX
• Languages - MS-DOS, BASIC, Pascal, Fortran, Assembler, C ++